The "power wall" has forced chip and system architects to design with smaller margins between nominal and worst-case operating points. Dynamic power, voltage noise and thermal management control loops have already become an integral part of chip and system design. New research papers in “wear out” and general reliability management have recently been published. These new generation management protocols have, however, opened up other sources of concern: e.g. control loop stability and robustness of the management protocols. The potential security holes exposed by the integrated control loops and system safety issues triggered by potential violations of power or thermal limits are other areas of concern. Also, side channel attack scenarios enabled by modulated power profiles have been documented in prior research. We seek to motivate the research community into adopting a holistic approach to mitigating the power wall and the concomitant reliability-security wall. We have coined the term "Energy-Secure System Architectures" to cover the range of research being pursued within industry and academia in order to ensure robust and secure functionality, while meeting the energy-related constraints of the "green computing" era. This segmented workshop offering, composed of lectures provided by experts in the areas of power/thermal management, reliability and security, provides a comprehensive view of the hardware and software aspects of Energy-Secure System Architectures. Authors are invited to submit an extended abstract (2 pages in length) on the workshop theme, focusing on the interactions of power management and security. Topics of interest include (but are not limited to):
Accepted papers will be presented at the workshop and included in the workshop report. Selected papers presented in the workshop will be invited to submit revised (updated) versions to a peer-reviewed special issue of IEEE Security and Privacy (to be organized; co-guest edited by the organizers of this workshop).
Extended abstracts must be in English of up to 2 pages. To submit extended abstracts to the workshop, click here. If you have questions regarding submission, please contact us: email@example.com, firstname.lastname@example.org
|Thursday May 9th, 2019|
|11:00 - 12:00||ESSA Registration (for HOST attendees and ESSA-only attendees)|
|13:15 - 13:30||Introduction and Welcoming Remarks|
|13:30 - 14:15||KEYNOTE 1: from Government|
|14:15 - 15:00||KEYNOTE 2: from Industry|
|15:00 - 15:30||BREAK|
|15:30 - 18:00||Technical Paper Session 1 (2 hour 30 minutes) [6x25]|
|18:00 - 21:00||Reception/Social Event (with Student Poster); joint with TAME workshop|
|Friday May 10th, 2019|
|07:00 - 08:00||Continental Breakfast [joint with TAME]|
|08:00 - 9:15||Panel Discussions|
|09:15 - 9:45||BREAK|
|09:45 - 11:45||Technical Paper Session 2 (2 hour 30 minutes) [6x25]|
|11:45 - 12:00||Closing Remarks|
Saibal Mukhopadhyay is a Professor at Georgia Tech. His interests focus on VLSI Systems and Digital Design, Electronic Design and Applications and Nanotechnology. He also worked at IBM T. J. Watson Research Center as research staff member where his research primarily focused on technology-circuit co-design methodologies for low-power and variation tolerant static random access memory (SRAM) in sub-65nm silicon technologies. Dr. Mukhopadhyay has (co)-authored over 250 papers in reputed conferences and journals and filed four United States patents. He is a Fellow of the IEEE.
Pradip Bose is a Distinguished Research Staff Member and manager of Efficient and Resilient Systems at IBM T. J. Watson Research Center. He has over thirty-three years of experience at IBM, and was a member of the pioneering RISC super scalar project at IBM (a pre-cursor to the first RS/6000 system product). He holds a Ph.D. degree from University of Illinois at Urbana-Champaign.